標題: 以FMEA縮短新產品之開發時程---以IC設計E公司為例
Applying FMEA to Shorten New Product Development Schedule --- A Case Study on Design House E
作者: 潘文景
Pan, Wen-Ching
張永佳
Chang, Yung-Chia
管理學院工業工程與管理學程
關鍵字: 失效模式與效應分析;IC設計公司;Failure Mode and Effects Analysis;IC Design house
公開日期: 2012
摘要: 本研究以IC設計E公司的主力產品鍵盤控制IC(Keyboard Controller,KBC)為例,從設計開發項目的產品定義規格到進行現場可編程邏輯陣列設計驗證測試的時程為最重要且其所佔整個新產品開發流程比例最高,其開發時程差異亦最大,影響著整體新產品開發時程的長短。因此本研究藉由失效模式與效應分析(Failure mode and effects analysis,FMEA)的特點,在新產品設計階段透過分析流程與輔助表格來進行新產品設計開發前的沙盤推演,來避開設計階段可能發生的潛在問題,使E公司能避免或減少新產品設計開發階段的失效模式,以縮短E公司的新產品開發時程,進而縮短新產品上市的時間,達成新產品搶先進入半導體市場之目標。
This research uses the major product "Keyboard Controller (KBC)" of the IC design house E as the example. Since the most important period of design & development items is from the definition of spec to field-programmable gate array design verification test, and the peiod occupies the highest percentages and has the most deviation in the whole new product development processes, the schedule of the whole new product development is affected by this period. Therefore, based on the characteristics of Failure Mode and Effect Analysis (FMEA), the study simulates the new product design steps through analysis processes and supportive tables to avoid any possible potential problem during design steps so that E company can prevent or decrease the faliure modes during new product design & development period, and shorten the new product development timeframe in E company to reduce "time to market" timeline to make new products scramble semiconductor market and get the opportunities in the very first place.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT079963527
http://hdl.handle.net/11536/50741
顯示於類別:畢業論文