Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | PENG, KL | en_US |
| dc.contributor.author | YU, SY | en_US |
| dc.date.accessioned | 2014-12-08T15:06:31Z | - |
| dc.date.available | 2014-12-08T15:06:31Z | - |
| dc.date.issued | 1979 | en_US |
| dc.identifier.issn | 0020-7217 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/5086 | - |
| dc.language.iso | en_US | en_US |
| dc.title | CHARACTERISTIC STUDIES OF VMOS AND UMOS | en_US |
| dc.type | Article | en_US |
| dc.identifier.journal | INTERNATIONAL JOURNAL OF ELECTRONICS | en_US |
| dc.citation.volume | 47 | en_US |
| dc.citation.issue | 5 | en_US |
| dc.citation.spage | 519 | en_US |
| dc.citation.epage | 522 | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.identifier.wosnumber | WOS:A1979JJ74000012 | - |
| dc.citation.woscount | 0 | - |
| Appears in Collections: | Articles | |
Loading...