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dc.contributor.author李榮源en_US
dc.contributor.authorLI, RONG-YUANen_US
dc.contributor.author李崇仁en_US
dc.contributor.author沈文仁en_US
dc.contributor.authorLI, CHONG-RENen_US
dc.contributor.authorSHEN, WEN-RENen_US
dc.date.accessioned2014-12-12T02:03:45Z-
dc.date.available2014-12-12T02:03:45Z-
dc.date.issued1985en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT742430042en_US
dc.identifier.urihttp://hdl.handle.net/11536/52448-
dc.description.abstract本文闡述一個對於組合電路的隨機性可測度計量之定義。此定義已寫成程式，其複雜
度與電路的大小成線性增加，並叮用來估算有限個測試長度的偵錯涵蓋率。		zh_TW
dc.language.isozh_TWen_US
dc.subject隨機性zh_TW
dc.subject可測度計量zh_TW
dc.subject估算zh_TW
dc.subject偵錯涵蓋率zh_TW
dc.title隨機性可測度計量與估算偵錯涵蓋率之應用zh_TW
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
Appears in Collections:Thesis


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