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dc.contributor.authorChen, Feng-Jungen_US
dc.contributor.authorChan, Chia-Hanen_US
dc.contributor.authorLiu, Kuo-Liangen_US
dc.contributor.authorHuang, Ying-Jungen_US
dc.contributor.authorPeng, Hwei-Lingen_US
dc.contributor.authorChang, Hwan-Youen_US
dc.contributor.authorYew, Tri-Rungen_US
dc.contributor.authorHsu, Ken Y.en_US
dc.contributor.authorHsu, Longen_US
dc.date.accessioned2014-12-08T15:06:54Z-
dc.date.available2014-12-08T15:06:54Z-
dc.date.issued2007en_US
dc.identifier.isbn978-0-8194-6792-8en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/5401-
dc.identifier.urihttp://dx.doi.org/10.1117/12.733097en_US
dc.description.abstractPili are bacterial appendages that play many important roles in bacterial behaviors, physiology and interaction with hosts. Via pili, bacteria are able to adhere to, migrate onto, and colonize on host cells, mechanically. Different from the most studied type I and P type pili, which are rigid and thick with an average of 6 similar to 7 nm in diameter, type 3 pili are relatively tiny (3-5 nm in diameter) and flexible, and their biophysical properties remains unclear. By using optical tweezers, we found that the elongation processes of type 3 pili are divided into three phases: (1) elastic elongation, (2) uncoiling-elongation, and (3) intrinsic elongation, separately. Besides, the uncoiling force of the recombinant pili displayed on the surface of E. coli [pmrkABCD(VI)F] is measured 20 pN in average stronger than that of E. coli [pmrkABCD(VI)]. This suggests that pilin MrkF is involved in determining the mechanical properties of the type 3 pili.en_US
dc.language.isoen_USen_US
dc.subjecttype 3 pilien_US
dc.subjectoptical tweezersen_US
dc.subjectmechanical propertiesen_US
dc.subjectuncoiling forceen_US
dc.titleUncoiling mechanism of Klebsiella pneumoniae type 3 pili measured by using optical tweezers - art. no. 66441Wen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.733097en_US
dc.identifier.journalOPTICAL TRAPPING AND OPTICAL MICROMANIPULATION IVen_US
dc.citation.volume6644en_US
dc.citation.spageW6441en_US
dc.citation.epageW6441en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000251162100035-
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