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dc.contributor.authorFu, Chang-Tsungen_US
dc.contributor.authorKuo, Chien-Nanen_US
dc.contributor.authorTaylor, Stewart S.en_US
dc.date.accessioned2014-12-08T15:07:04Z-
dc.date.available2014-12-08T15:07:04Z-
dc.date.issued2010-04-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2010.2041570en_US
dc.identifier.urihttp://hdl.handle.net/11536/5544-
dc.description.abstractThe simultaneous noise and impedance matching (SNIM) condition for a common-source amplifier is analyzed. Transistor noise parameters are derived based on the more complete hybrid-pi model, and the dominant factors jeopardizing SNIM are identified. Strategies for narrowband and broadband SNIM (BSNIM) are derived accordingly. A dual reactive feedback circuit along with an LC-ladder matching network is proposed to achieve the BSNIM. It includes a capacitive and an inductive feedback, where the former utilizes the transistor parasitic gate-to-drain capacitance and the latter is formed by transformer coupling. This circuit topology has been validated in 0.18- and 0.13-mu m CMOS technologies for a 3-11-GHz ultra-wideband (UWB) and a 2.4-5.4-GHz multistandard application, respectively. The 3-11-GHz UWB low-noise amplifier is detailed as a design example.en_US
dc.language.isoen_USen_US
dc.subjectBroadband input matchingen_US
dc.subjectcapacitive feedbacken_US
dc.subjectlow-noise amplifier (LNA)en_US
dc.subjectlow poweren_US
dc.subjectnoise optimized designen_US
dc.subjectsimultaneous noise and impedance matching (SNIM)en_US
dc.subjecttransformer feedbacken_US
dc.subjectultra-wideband (UWB)en_US
dc.titleLow-Noise Amplifier Design With Dual Reactive Feedback for Broadband Simultaneous Noise and Impedance Matchingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMTT.2010.2041570en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume58en_US
dc.citation.issue4en_US
dc.citation.spage795en_US
dc.citation.epage806en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000276619900012-
dc.citation.woscount12-
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