Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry

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DC 欄位	值	語言
dc.contributor.author	Chiu, MH	en_US
dc.contributor.author	Lee, JY	en_US
dc.contributor.author	Su, DC	en_US
dc.date.accessioned	2014-12-08T15:01:47Z	-
dc.date.available	2014-12-08T15:01:47Z	-
dc.date.issued	1997-05-01	en_US
dc.identifier.issn	0003-6935	en_US
dc.identifier.uri	http://hdl.handle.net/11536/558	-
dc.description.abstract	A new method for measuring the refractive index is presented, First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium. (C) 1997 Optical Society of America.	en_US
dc.language.iso	en_US	en_US
dc.title	Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry	en_US
dc.type	Article	en_US
dc.identifier.journal	APPLIED OPTICS	en_US
dc.citation.volume	36	en_US
dc.citation.issue	13	en_US
dc.citation.spage	2936	en_US
dc.citation.epage	2939	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Department of Photonics	en_US
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