Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | CHEN, Z | en_US |
dc.contributor.author | FU, KS | en_US |
dc.date.accessioned | 2014-12-08T15:07:12Z | - |
dc.date.available | 2014-12-08T15:07:12Z | - |
dc.date.issued | 1977 | en_US |
dc.identifier.issn | 0018-9472 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/5651 | - |
dc.language.iso | en_US | en_US |
dc.title | NONPARAMETRIC BAYES RISK ESTIMATION FOR PATTERN-CLASSIFICATION | en_US |
dc.type | Article | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS | en_US |
dc.citation.volume | 7 | en_US |
dc.citation.issue | 9 | en_US |
dc.citation.spage | 651 | en_US |
dc.citation.epage | 656 | en_US |
dc.contributor.department | 資訊工程學系 | zh_TW |
dc.contributor.department | Department of Computer Science | en_US |
dc.identifier.wosnumber | WOS:A1977DS38100003 | - |
dc.citation.woscount | 3 | - |
Appears in Collections: | Articles |
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