互補式金氧半可靠性的嶄新觀察:漏電流及鎖定

Full metadata record

DC Field	Value	Language
dc.contributor.author	趙崑章	en_US
dc.contributor.author	Zhao, Kun Zhang	en_US
dc.contributor.author	陳明哲	en_US
dc.contributor.author	Chen, Ming Zhe	en_US
dc.date.accessioned	2014-12-12T02:12:49Z	-
dc.date.available	2014-12-12T02:12:49Z	-
dc.date.issued	1993	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#NT822430023	en_US
dc.identifier.uri	http://hdl.handle.net/11536/58537	-
dc.language.iso	en_US	en_US
dc.title	互補式金氧半可靠性的嶄新觀察:漏電流及鎖定	zh_TW
dc.title	New observations in CMOS reliability	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子研究所	zh_TW
Appears in Collections:	Thesis