可靠度應力篩選程序分析-IBM失效率模型於電子工業之應用

Abstract

本論文主旨在於探討在最低可靠度應力篩選相關成本總和的要求下，如何決定最適切的可靠度應力篩選程序參數。本研究使用IBM失效率模型作為分析的基礎，討論篩選應力水準對系統潛在缺陷及其失效率浴缸曲線的影響，並配合一組新的外部成本考量方式，而建立一個應力篩選程序的成本最適化模式。

The purpose of this paper is to choose the optimum reliability stress screening process parameters under the requirement of the minimum total cost that relate to reliability stress screening process. In this paper, we use IBM failure rate model as a base for data analysis. The effect of screening stress level for the latent defect in systems and it's failure rate bathtub curve will be discussed. A new method will be developed for the estimate of external cost. The purpose of all the work above is to build an optimum cost model for the screening stress processes.