完整後設資料紀錄
DC 欄位語言
dc.contributor.author劉福裾en_US
dc.contributor.authorFu-Chu Liuen_US
dc.contributor.author唐麗英en_US
dc.contributor.authorLee-Ing Tongen_US
dc.date.accessioned2014-12-12T02:13:08Z-
dc.date.available2014-12-12T02:13:08Z-
dc.date.issued1994en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT830030045en_US
dc.identifier.urihttp://hdl.handle.net/11536/58810-
dc.description.abstract本研究的主要目的,在於針對少量多樣(新速)的產品,發展一個綜合性製 程能力指標,以評估整個生產線的製程能力,此可輔助業者決定產品的成 本與售價,更可協助業者如何去安排生產線較佳的製程組合(如瓶頸機器 的安置點)或輔助循序生產製程的設計。本研究首先是利用資料轉換的方 式,合併自不同批號所抽出的樣本,使其可視同來自相同批號下抽取的樣 本。另外根據過去學者所提出不同評估製程變異的方法,與透過允收界限 的修正,來構建產品為少量多樣的製程能力指標。本研究並透過模擬方法 ,就所構建的製程能力指標,分別計算其瑕疵率與製程能力指標變動標準 差;藉由比較瑕疵率,找出一個小樣本下的製程能力指標與傳統大樣本下 的製程能力指標間瑕疵率最為接近的,同時比較小樣本的製程能力指標變 動標準差,找出變動標準差較小者,如此,同時具有此兩特性的小樣本的 製程能力指標,便是本研究最後所要之少量多樣的製程能力指標。 The main purpose of this research is to aimed at developing a synthetic process capability index for few variety (short run) products in order to evaluate the entire process capability of the production line. This would help traders to decide a proper cost and selling price for the product ,and help them to arrange a better process synthesis of production line (like the fixed point of a bottle machine ) or design for effective production process. This research has first combined different samples from various wholesale items and made them appear somewhat similar through data transformation. Morever , it constructed products into short run pci in accordance with the different ways of evaluating process change given before by specialists and through the amendment of control specification limit . With the use of its constructed pci , this research also separately calculated the defect rate and pci change standard difference through simulation.Then, by comparing the defect rates,it figures out the nearest pci defect rate between small samples and traditionally big ones,at the same time ,compares the pci change difference of the small samples and finds out its smallest change standard difference .In this way ,We will arrived at a small sample with doubled quality pci ,Which is also the main focus of this research --- a short run pci .zh_TW
dc.language.isozh_TWen_US
dc.subject新速;製程能力指標;瑕疵率;允收界限;資料轉換zh_TW
dc.subjectShort Run;Process Capability Index(PCI);Defect Rate; Specification Limit;Data Transformationen_US
dc.title新速製程能力指標之研究zh_TW
dc.titleDevelopment of Capability Index for Short Run Control Chartsen_US
dc.typeThesisen_US
dc.contributor.department工業工程與管理學系zh_TW
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