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dc.contributor.authorLu, Chien-Pangen_US
dc.contributor.authorChao, Mango Chia-Tsoen_US
dc.contributor.authorLo, Chen-Hsingen_US
dc.contributor.authorChang, Chih-Weien_US
dc.date.accessioned2014-12-08T15:07:29Z-
dc.date.available2014-12-08T15:07:29Z-
dc.date.issued2010-02-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2009.2040011en_US
dc.identifier.urihttp://hdl.handle.net/11536/5898-
dc.description.abstractTo reduce the time-to-market and photomask cost for advanced process technologies, metal-only engineering change order (ECO) has become a practical and attractive solution to handle incremental design changes. Due to limited spare cells in metal-only ECO, the new added netlist may often violate the input-slew and output-loading constraints and, in turn, delay or even fail the timing closure. This paper presents a framework, named metal-only ECO slew/cap solver (MOESS), to resolve the input-slew and output-loading violations by connecting spare cells onto the violated nets as buffers. MOESS performs two buffer-insertion schemes in a sequential manner to first minimize the number of inserted buffers and then resolve timing violations, if any. The experimental results based on industrial designs demonstrate that MOESS can resolve more violations with fewer inserted buffers and less central processing unit runtime compared to an electronic design automation vendor's solution.en_US
dc.language.isoen_USen_US
dc.subjectEngineering change order (ECO)en_US
dc.subjectphysical designen_US
dc.subjectslew/loading violationen_US
dc.titleA Metal-Only-ECO Solver for Input-Slew and Output-Loading Violationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2009.2040011en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume29en_US
dc.citation.issue2en_US
dc.citation.spage240en_US
dc.citation.epage245en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000273928400008-
dc.citation.woscount3-
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