完整後設資料紀錄
DC 欄位語言
dc.contributor.author林寶全en_US
dc.contributor.authorBao-Chyuan Linen_US
dc.contributor.author張俊彥en_US
dc.contributor.authorChun-Yen Changen_US
dc.date.accessioned2014-12-12T02:13:46Z-
dc.date.available2014-12-12T02:13:46Z-
dc.date.issued1994en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT830430065en_US
dc.identifier.urihttp://hdl.handle.net/11536/59254-
dc.description.abstract本論文中,我們已成功的利用超高真空化學氣相沉積成長出矽與矽鍺異質 接面,利用Shubnikov de Hass (SdH) 分析量測,可證實矽與矽鍺異質接 面有二維電洞雲存在,並可得到其電洞遷移率在0.35 K時為11,000 cm2 V-1s-1,且其電洞濃度為3.8e11 cm-2 。我們並研製5微米閘極之p型通道 矽與矽鍺調變攙雜場效電晶體(MODFET),其互導可達9.25 mS/mm。另外, 我們研製5微米閘極δ攙雜矽鍺金半場效電晶體(MESFET),其互導可 達2.33 mS/mm。 In this thesis , we have sucessfully grown Si/SiGe heterojunction . The existence of the 2DHG in the Si/SiGe heterojunction is confirmed by the Shubnikov de Hass measurement . The mobility is found to be 11,000 cm2V-1s-1 and sheet carrier density is 3.8e11 cm-2 at 0.35 K . We have also fabricated p-channel Si/SiGe MODFET and boron delta-doped SiGe MESFET , the extinsic transconductance can reach 9.25 mS/mm and 2.33 mS/mm , respectively .zh_TW
dc.language.isoen_USen_US
dc.subject矽鍺;調變攙雜;δ-攙雜.zh_TW
dc.subjectSiGe;Modulation-Doped;Delta-Doped.en_US
dc.title利用超高真空化學氣相沉積成長P型通道矽鍺調變攙雜及δ攙雜場效電晶體zh_TW
dc.titleP-Channel SiGe Modulation-Doped and δ-Doped Field Effect Transistor Grown by UHV/CVDen_US
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
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