標題: Uncertainty Analysis on Precision Measurement for Polystyrene Nanospheres Using Dynamic Light Scattering
作者: Pan, Shan-Peng
Weng, Han-Fu
Lin, Chih-Min
Liu, Tzong-Shi
機械工程學系
Department of Mechanical Engineering
公開日期: 2010
摘要: Dynamic light scattering (DLS) is the most commonly used technique for measuring nanosphere sizes. In order to establish the traceability of the DLS method to SI units, relevant parameters have been measured in this study. Several studies have been reported on error sources in DLS. However, these studies lacked a systematic method of analyzing the uncertainty of DLS. In this paper we describe the DLS method and present a measurement uncertainty budget. Monodispersed polystyrene latex (PSL) spheres are selected as reference materials in the uncertainty evaluation. The measured nanosphere sizes are 20, 50, 100, 300, 500, and 1000 nm, among which the measurement results of 100, 300, and 500 nm nanospheres obtained using DLS are compared with those for an electrogravitational aerosol balance (EAB) method. The uncertainties for both methods are calculated, and the results of repeated measurements are presented with confidence levels of 95%. (C) 2010 The Japan Society of Applied Physics
URI: http://hdl.handle.net/11536/6045
http://dx.doi.org/10.1143/JJAP.49.06GK05
ISSN: 0021-4922
DOI: 10.1143/JJAP.49.06GK05
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS
Volume: 49
Issue: 6
Appears in Collections:Articles


Files in This Item:

  1. 000278966300082.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.