标题: 搀杂Nb元素之Z5U-BME陶瓷电容器的介电和电学性质之研究
Dielectrics and Electrical Properties of Nb doped Z5U-BME Capacitors
作者: 陈建余
Chen, Chien-Yu
曾俊元
Tseung-Yuen Tseng
电子研究所
关键字: 空间电荷箝制电流;烧结助剂;居里温度点;SCLC;Sintering aid;Curie temperature
公开日期: 1995
摘要: 本论文内容,主要在于研发制作Z5U-BME钛酸钡陶瓷电容器之介电
材料,在实验中我们以镍电极共烧的方法将试片在还原气氛底下烧结,并
经过一适当的退火程序以弥补在还原气氛下所造成的氧缺陷.根据我们的
研究结果得知Dy和Nb的搀杂有助于介电常数的提高,介电损失的降低和延
长电容器的生命期.此外我们发现在搀杂Dy和Nb原素的试片中,随着Dy和
Nb搀杂量的提高,半导化行为将会出现,我们推测其原因可能是Dy和Nb搀
杂量的提高导致施体和受体的电荷不平衡.对于Nb搀杂的试片,其居里温
度点大约在2度C左右,除此之外我们也做了积层式陶瓷电容器的电流和电
压的量测,藉着分析电流和电压的关系,试片的电流模型就可分辨出来,
一般来说这些电流模型可分为:欧姆,空间电荷箝制电流(点电极),和空
间电荷箝制电流(平面电极).为了得到良好的介电性质,一些实验制程上
的参数如:B/A 的比例,施体和受体元素的选择烧结的气氛,烧结助剂的
选用,锰元素的搀杂量,退火的温度和气氛,都必须控制在适当的条件.
Barium titanate doped with various amounts of CaCO3,
ZrO2, Dy2O3,Nb2O5, and MnO2 was used for the preparation
of Z5U-BME dielectrics.The dielectric samples with nickel
electrodes were sintered in low oxygen partial pressure
to prevent the oxidation of the electrode,and their
electrical and hpysical properties were measured.
Additionsof Dy and Nb into the samples could obtain higher
dielectric constant, lower dissipation factor, and
prolonging lifetime. Besides, it wasfound that the
dissipation factor of the sample was
sensitivelydependent on the amounts of Nb and Dy addition.
The dielectric sample lost their properties and became
semiconductive if excess of Nb or Dywas used. The Curie
point is about = 2oC for the samples doped with Nb.
Additionally, the current-voltage characteristics of multilayer
capacitorswere also measured and analysized. The
characteristic of the devicemeasured at room temperature is
ohmic on the basis of 1 power voltage-current relationship.
The near 3/2 power current-voltage characteristic(I~V3/2) of
specimens measured at high temperature can be attributed
toelectron emission from electrode points. The quardratic
behaviour (I~V2)observed for the samples measured at higher
temperature represent spacecharge limited emission from near
planar electrodes.
URI: http://140.113.39.130/cdrfb3/record/nctu/#NT840430047
http://hdl.handle.net/11536/60648
显示于类别:Thesis