在製程檢驗型II誤差下缺貨成本對EMQ模型之影響

Full metadata record

DC Field	Value	Language
dc.contributor.author	林正旺	en_US
dc.contributor.author	Lin, Chang-Wang	en_US
dc.contributor.author	唐麗英	en_US
dc.contributor.author	Lee-Ing Tong	en_US
dc.date.accessioned	2014-12-12T02:16:46Z	-
dc.date.available	2014-12-12T02:16:46Z	-
dc.date.issued	1996	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#NT850031006	en_US
dc.identifier.uri	http://hdl.handle.net/11536/61444	-
dc.language.iso	zh_TW	en_US
dc.subject	惡化	zh_TW
dc.subject	不完美	zh_TW
dc.subject	deteration	en_US
dc.subject	imperfect	en_US
dc.title	在製程檢驗型II誤差下缺貨成本對EMQ模型之影響	zh_TW
dc.title	The Effects of Shortage Cost to The Imperfect EMQ Model under Type II Inspection Error	en_US
dc.type	Thesis	en_US
dc.contributor.department	工業工程與管理學系	zh_TW
Appears in Collections:	Thesis