線方法分析分層介質和非分層介質之微帶線特性

Abstract

本文利用線方法分析分層介質和非分層介質之微帶線特性,此方法能分析 主模態和高階模態的傳播模態,鄰近效應,在封閉結構高階模態對頂層的影 響有廣泛研究,另外用線方法結合吸收邊界條件分析開放的微帶線結構亦 被研究.用此方法所得數值結果在封閉和開放結構都非常吻合其他文獻. A method of lines (MOL) program is developed for the analysis of shielded and open finite thickness microstrip line on layered and nonlayered dielectricsubstrates. The method is used to determine the propagation constants of dominant higher-order modes. The influence of the top cover on the higher order modes in a closed structure is extensively investigated. The MOL absorption boundary condition is incorporated into our formulation for the analysis of open structure. The results obtainted here are in very good agreement with the published data for closed and open microstrip.