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dc.contributor.author陳永昌en_US
dc.contributor.authorChen, Yong-changen_US
dc.contributor.author賴映杰en_US
dc.contributor.authorY. Laien_US
dc.date.accessioned2014-12-12T02:18:30Z-
dc.date.available2014-12-12T02:18:30Z-
dc.date.issued1997en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT860124003en_US
dc.identifier.urihttp://hdl.handle.net/11536/62656-
dc.description.abstract我們發展了一套半導體製程中微影步驟的模擬程式,可以計算曝光系統在 光阻中產生的潛像,並依此潛像得出顯影後的光阻外型。其中包括光學投 影系統的模擬方法,以及將光阻視為薄膜來計算光阻中的潛像光強分布, 並以Dill及Mack模型得出光活性化合物濃度及顯影速率分布,最後利用最 小作用量原理及Runge-Kutta數值方法算出顯影後的光阻外型。論文中以 接觸孔、獨立線及連續孔線為例,示範了計算的結果。 In this thesis we develop a computer simulation program that can simulate optical projection systems and can perform automatic computer generation of a corrected mask pattern for any given original mask pattern (traditional or halftone). The correction is done to minimize the mismatch between the image pattern and the target pattern. We also study the impacts of such mask correction on the exposure-defocus latitude of the projection system.zh_TW
dc.language.isozh_TWen_US
dc.subject光學鄰近效應zh_TW
dc.subject高解析光蝕刻技術zh_TW
dc.subjectOptical Proximity Correctionen_US
dc.subjectHigh Resolution Lithographyen_US
dc.title半穿透式移相光罩之自動化光學鄰近效應修正zh_TW
dc.titleAutomatic Optical Proximity Correction of Halftone Phase- shifting Masksen_US
dc.typeThesisen_US
dc.contributor.department光電工程學系zh_TW
Appears in Collections:Thesis