Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 陳坤聰 | en_US |
| dc.contributor.author | Chen, Kun-Tsung | en_US |
| dc.contributor.author | 趙于飛 | en_US |
| dc.contributor.author | Y.F. Chao | en_US |
| dc.date.accessioned | 2014-12-12T02:18:30Z | - |
| dc.date.available | 2014-12-12T02:18:30Z | - |
| dc.date.issued | 1997 | en_US |
| dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT860124008 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/62662 | - |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 橢圓術 | zh_TW |
| dc.subject | 光學參數 | zh_TW |
| dc.subject | 橢圓參數 | zh_TW |
| dc.subject | 塊材 | zh_TW |
| dc.subject | 薄膜 | zh_TW |
| dc.subject | 折射率 | zh_TW |
| dc.subject | Ellipsometry | en_US |
| dc.subject | optical constant | en_US |
| dc.subject | ellipsometric constant | en_US |
| dc.subject | bulk | en_US |
| dc.subject | thin film | en_US |
| dc.subject | refractive index | en_US |
| dc.title | 橢圓偏光儀中光學參數之判定 | zh_TW |
| dc.title | Graphically determine optical constant in Ellipsometric measurement | en_US |
| dc.type | Thesis | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| Appears in Collections: | Thesis | |

