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dc.contributor.authorAhn, H.en_US
dc.contributor.authorYeh, Y. -J.en_US
dc.contributor.authorHong, Y. -L.en_US
dc.contributor.authorGwo, S.en_US
dc.date.accessioned2014-12-08T15:08:04Z-
dc.date.available2014-12-08T15:08:04Z-
dc.date.issued2009-12-07en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3270042en_US
dc.identifier.urihttp://hdl.handle.net/11536/6317-
dc.description.abstractWe report carrier concentration-dependence of terahertz emission from magnesium doped indium nitride (InN:Mg) films. Near the critical concentration (n(c) similar to 1 x 10(18) cm(-3)), the competition between two emission mechanisms determines the polarity of terahertz emission. InN: Mg with n > n(c) exhibits enhanced positive polarity terahertz emission compared to the undoped InN, which is due to the reduced screening of the photo-Dember field. For InN: Mg with n < n(c), the polarity of terahertz signal changes to negative, indicating the dominant contribution of the surface electric field due to the large downward surface band bending within the surface layer extending over the optical absorption depth. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3270042]en_US
dc.language.isoen_USen_US
dc.titleTerahertz emission mechanism of magnesium doped indium nitrideen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.3270042en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume95en_US
dc.citation.issue23en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000272627700036-
dc.citation.woscount14-
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