完整後設資料紀錄
DC 欄位語言
dc.contributor.author許政雄en_US
dc.contributor.authorXu, Zheng-Xiongen_US
dc.contributor.author高曜煌en_US
dc.contributor.authorGao, Yue-Huangen_US
dc.date.accessioned2014-12-12T02:19:46Z-
dc.date.available2014-12-12T02:19:46Z-
dc.date.issued1997en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT864435002en_US
dc.identifier.urihttp://hdl.handle.net/11536/63641-
dc.description.abstractAt high frequency, oscillator is normally designed from [S] parameters because of complicated parasitic. While the basic origins of existing negative resistance can not be easily figured out. In this study, the negative resistance of six configurations are examined by appropriate model of HEMT. The frequency ranges of existing negative resistance are predicted. The results are applied to a 20GHz DRO as well as a YIG oscillator. 20GHz DRO is realized directly by the packaged active device and 20GHz DR from the view point of low cost fabrication. The DRO with reasonable performances of output power of -18 dBm and -70dBc/Hz phase noise at 100KHz offset is obtained.zh_TW
dc.language.isozh_TWen_US
dc.subject介質振盪器zh_TW
dc.subject陶瓷封裝zh_TW
dc.subject負阻抗zh_TW
dc.subject電晶體zh_TW
dc.subject20GHz 介質振盪器zh_TW
dc.subjectYIG 振盪器zh_TW
dc.subject電信zh_TW
dc.subject電子工程zh_TW
dc.subjectDROen_US
dc.subjectpackageen_US
dc.subjectNegative resistanceen_US
dc.subjectHEMTen_US
dc.subject20GHz DROen_US
dc.subjectYIG oscillatoren_US
dc.subjectTELECOMMUNICATIONen_US
dc.subjectELECTRONIC-ENGINEERINGen_US
dc.title利用陶瓷封裝電晶體設計20GHz介質振盪器之研究zh_TW
dc.title20GHz DRO Design usign Package Componentsen_US
dc.typeThesisen_US
dc.contributor.department電信工程研究所zh_TW
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