標題: | Hard repulsive barrier in hot adatom motion during dissociative adsorption of oxygen on Ag(100) |
作者: | Hsieh, Ming-Feng Lin, Deng-Sung Gawronski, Heiko Morgenstern, Karina 物理研究所 Institute of Physics |
關鍵字: | adsorbed layers;adsorption;dissociation;oxygen;scanning tunnelling microscopy;silver |
公開日期: | 7-十一月-2009 |
摘要: | Random pairing simulation and low temperature scanning tunneling microscopy (STM) are used to investigate the detailed O(2) dissociative adsorption processes at 200 K for various coverages. The distribution of oxygen adatoms shows a strong repulsion between the adsorbates with a radius of similar to 0.8 nm. The comparison between STM results and simulation reveals two prominent pairing distances of 2 and 4 nm and their branching ratio is about 2:1. These findings shed new light on the origin of the large intrapair distances found and on the process behind the empirical "eight-site rule.". |
URI: | http://dx.doi.org/10.1063/1.3258849 http://hdl.handle.net/11536/6438 |
ISSN: | 0021-9606 |
DOI: | 10.1063/1.3258849 |
期刊: | JOURNAL OF CHEMICAL PHYSICS |
Volume: | 131 |
Issue: | 17 |
結束頁: | |
顯示於類別: | 期刊論文 |