陽極氧化製備五氧化二鉭薄膜及其結構與電性研究

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	謝志宏	en_US
dc.contributor.author	Hsieh ching hon	en_US
dc.contributor.author	謝宗雍	en_US
dc.contributor.author	Dr. Hsieh	en_US
dc.date.accessioned	2014-12-12T02:22:35Z	-
dc.date.available	2014-12-12T02:22:35Z	-
dc.date.issued	1999	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#NT880159037	en_US
dc.identifier.uri	http://hdl.handle.net/11536/65313	-
dc.description.abstract	以陽極氧化法製備高品質因子的五氧化二鉭薄膜並就其結構與電性量測做研究與討論	zh_TW
dc.description.abstract	disscussion of structure and electrical properties of tantalum pentoxide films prepared by anodic oxidation	en_US
dc.language.iso	zh_TW	en_US
dc.subject	五氧化二鉭	zh_TW
dc.subject	陽極氧化法	zh_TW
dc.subject	tantalum pentoxide	en_US
dc.subject	anodic oxidation	en_US
dc.title	陽極氧化製備五氧化二鉭薄膜及其結構與電性研究	zh_TW
dc.title	Structure and electrical properties of tantalum pentoxide films prepared by anodic oxidation	en_US
dc.type	Thesis	en_US
dc.contributor.department	材料科學與工程學系	zh_TW
顯示於類別：	畢業論文