Full metadata record
DC FieldValueLanguage
dc.contributor.authorPan, LiDongen_US
dc.contributor.authorWang, Shunen_US
dc.contributor.authorHsu, C. S.en_US
dc.contributor.authorHuang, C. C.en_US
dc.date.accessioned2019-04-03T06:37:33Z-
dc.date.available2019-04-03T06:37:33Z-
dc.date.issued2009-10-30en_US
dc.identifier.issn0031-9007en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevLett.103.187802en_US
dc.identifier.urihttp://hdl.handle.net/11536/6548-
dc.description.abstractFree standing films of a liquid crystal compound with simple surface enhanced order were studied. The resultant phase diagram demonstrates that (1) the short helical pitch smectic-C-alpha* phase disappears below a film thickness of 10 layers, and (2) the temperature window of a distorted 4 layer smectic-C-FI2* phase increases dramatically upon decreasing film thickness. The experimental findings were attributed to the reduced dimensionality and enhanced surface effects in thin films. The results of the smectic-C-alpha* phase are consistent with what have been reported for helically ordered magnetic thin films, with a noticeable difference due to the opposite effect of the surface on ordering in the two systems.en_US
dc.language.isoen_USen_US
dc.titleThickness Dependent Phase Behavior of Antiferroelectric Liquid Crystal Filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevLett.103.187802en_US
dc.identifier.journalPHYSICAL REVIEW LETTERSen_US
dc.citation.volume103en_US
dc.citation.issue18en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000271352400044en_US
dc.citation.woscount9en_US
Appears in Collections:Articles


Files in This Item:

  1. 17d05eac308d005052047a9957f06ea9.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.