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dc.contributor.authorLin, Wei-Hsunen_US
dc.contributor.authorTseng, Chi-Cheen_US
dc.contributor.authorChao, Kuang-Pingen_US
dc.contributor.authorMai, Shu-Chengen_US
dc.contributor.authorLin, Shih-Yenen_US
dc.contributor.authorWu, Meng-Chyien_US
dc.date.accessioned2014-12-08T15:08:44Z-
dc.date.available2014-12-08T15:08:44Z-
dc.date.issued2009-09-15en_US
dc.identifier.issn1041-1135en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LPT.2009.2026630en_US
dc.identifier.urihttp://hdl.handle.net/11536/6677-
dc.description.abstractA ten-period InAs-GaAs quantum-dot infrared photodetector (QDIP) with 8-nm In(0.15)Ga(0.85) As capping layer grown after quantum-dot (QD) deposition is investigated. With reduced InAs QD coverage down to 2.0 mono-layers, responses at 10.4 and 8.4 mu m are observed for the device under positive and negative biases, respectively. The phenomenon is attributed to the large Stark effect resulted from the asymmetric band diagrams of the device under different voltage polarities. The demonstration of long-wavelength infrared detections with the simple structures of the InGaAs-capped QDIP is advantageous for the development of multicolor QDIP focal-plane arrays.en_US
dc.language.isoen_USen_US
dc.subjectQuantum-dot infrared photodetectors (QDIPs)en_US
dc.titleInGaAs-Capped InAs-GaAs Quantum-Dot Infrared Photodetectors Operating in the Long-Wavelength Infrared Rangeen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LPT.2009.2026630en_US
dc.identifier.journalIEEE PHOTONICS TECHNOLOGY LETTERSen_US
dc.citation.volume21en_US
dc.citation.issue18en_US
dc.citation.spage1332en_US
dc.citation.epage1334en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000269684100008-
dc.citation.woscount11-
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