標題: Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall
作者: Li, Chung-Wei
Tzeng, Gwo-Hshiung
科技管理研究所
Institute of Management of Technology
關鍵字: DEMATEL;Multiple criteria decision-making (MCDM);Entropy;Maximum mean de-entropy (MMDE) algorithm
公開日期: 1-Aug-2009
摘要: To deal with complex problems, structuring them through graphical representations and analyzing causal influences can aid in illuminating complex issues, systems, or concepts. The DEMATEL method is a methodology which can confirm interdependence among variables and aid in tire development of a chart to reflect interrelationships between variables, and can be used for researching and solving complicated and intertwined problem groups. The end product of the DEMATEL process is a visual representation-the impact-relations map-by which respondents organize their own actions in the world. In order to obtain a suitable impact-relations map, an appropriate threshold value is needed to obtain adequate information for further analysis and decision-making. In the existing literature, the threshold value has been determined through interviews with respondents or judged by the researcher. In most cases, it is hard and time-consuming to aggregate the respondents and make a consistent decision. In addition, in order to avoid subjective judgments, a theoretical method to select the threshold value is necessary. In this paper, we propose a method based on the entropy approach, the maximum mean de-entropy algorithm, to achieve this purpose. Using a real case to find the interrelationships between the services of a Semiconductor Intellectual Property Mall as an example, we will compare the results obtained from the respondents and from our method, and show that the impact-relations maps from these two methods could be the same. (C) 2009 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.eswa.2009.01.073
http://hdl.handle.net/11536/6867
ISSN: 0957-4174
DOI: 10.1016/j.eswa.2009.01.073
期刊: EXPERT SYSTEMS WITH APPLICATIONS
Volume: 36
Issue: 6
起始頁: 9891
結束頁: 9898
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