完整後設資料紀錄
DC 欄位語言
dc.contributor.author余偉民en_US
dc.contributor.author彭文理en_US
dc.contributor.authorW.L.Pearnen_US
dc.date.accessioned2014-12-12T02:29:53Z-
dc.date.available2014-12-12T02:29:53Z-
dc.date.issued2002en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT910031066en_US
dc.identifier.urihttp://hdl.handle.net/11536/69826-
dc.description.abstractLED / IRED had been widely used for a long time due to its low cost and low current characteristic. Also it is a mature process in Taiwan. There are many steps in LED package process, die mount, wire bond, encap…. and so on. But wire bonding is the most critical & important process due to reliability concern. In general speaking, pull tension test had been used to measure the bonding quality. Conventional repeatability and reproducibility studies involve multiple measurements of same specimen by multiple operators. All results base on the samples are non-destructed after test. This approach can’t be applied on pull tension test. As a result, within-sample variability become an issue. In this study, we selected 1 low variation material from 2 experimental groups and treat the variability comes from equipment. Comparing to normal pull tension test, equipment variation only take 17% of total variation. We can conclude that this measurement system is “ Fair “. On the other hand, one year process pull tension test data are collected and process capability index (CPL) is applied to find out the optimal range of parameters through “ Quadratic Smooth “ of “ Statistica “.zh_TW
dc.language.isoen_USen_US
dc.subjectGR&Rzh_TW
dc.subjectProcess Capabilityzh_TW
dc.titleOptimal Parameters on IRED Wire Bonding Process Capability : Power, Timezh_TW
dc.typeThesisen_US
dc.contributor.department工業工程與管理學系zh_TW
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