Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 呂坤樹 | en_US |
dc.contributor.author | Kun-Shu Lu | en_US |
dc.contributor.author | 巫木誠 | en_US |
dc.contributor.author | Mu-Cheng Wu | en_US |
dc.date.accessioned | 2014-12-12T02:32:04Z | - |
dc.date.available | 2014-12-12T02:32:04Z | - |
dc.date.issued | 2002 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT911031010 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/71220 | - |
dc.description.abstract | 在半導體廠生產過程中,控擋片是用來監測製程品質是否穩定的工具,特定製程的控片使用後可以降轉給下級的製程控片使用,降轉的路徑會有多重選擇,控片降級決策的目的是要決定每條路徑的降轉數量,過去關於降轉決策的研究主要在最小化短期內的控片花費。 本論文發展一個線性規劃模式來做控片降級決策,以最小化長期的控片花費,經由控片成本分析發現用量成本遠大於存貨成本,因此本研究假設可提高安全存量來吸納短期的需求變異,則降轉決策問題便可簡化成靜態網路流量平衡問題,可利用線性規劃來求解,此靜態降轉決策的方法大幅簡化了現場管理的複雜度。 | zh_TW |
dc.description.abstract | Control/dummy (C/D) wafers are metrology materials for measuring the process quality in semiconductor fab. C/D wafers of a particular process, after use, may need to be downgraded to one of several downstream processes. The decision of downgrading C/D wafers is to determine the quantity for allocating to each downstream process. Previous studies solved the downgrading decision problem on a short-term basis, which aimed to maximize the short-term C/D wafer costs. This thesis develops a linear programming model for the downgrading decision to maximize the long-term C/D wafer costs. An analysis of the cost items of C/D wafers reveals that the usage cost is much higher than the inventory cost. Therefore, this research assumes that the safety stock of C/D wafers is so highly prepared that it can absorb the short-term demand fluctuation. The downgrading decision problem is simplified to a static network balance problem and can be solved by the proposed linear program. This approach, a static downgrading policy, greatly simplifies the management complexity of shop floor operation. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 控擋片 | zh_TW |
dc.subject | 降轉決策 | zh_TW |
dc.subject | control wafers | en_US |
dc.subject | decisions for downgrading | en_US |
dc.subject | test wafers | en_US |
dc.title | 晶圓廠控擋片降轉決策 | zh_TW |
dc.title | Decisions for Downgrading Control/Dummy Wafers in Semiconductor Fabs | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 管理學院工業工程與管理學程 | zh_TW |
Appears in Collections: | Thesis |