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dc.contributor.author陳慧珊en_US
dc.contributor.authorChen, Huei-Shanen_US
dc.contributor.author李永銘en_US
dc.contributor.authorLi, Yung-Mingen_US
dc.date.accessioned2014-12-12T02:32:39Z-
dc.date.available2014-12-12T02:32:39Z-
dc.date.issued2012en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT070063403en_US
dc.identifier.urihttp://hdl.handle.net/11536/71490-
dc.description.abstract軟體測試在現在資訊發達的時代裡,是一個重要的名詞,它能夠幫助我們減少系統安全的風險,對軟體系統做上線前的最後檢視,因此,本研究論文計畫是一個以X公司之晶圓下線系統為例的個案研究,目的在實際建構出一個以單元測試為主的自動化測試流程,來改善以往人工測試的不便與時程的浪費,也能改善人工測試容易漏測而造成的系統上線後的問題,除了實作與探討單元測試外,並做出個案之效益分析的評估。 本研究計畫透過改良啟發式測試策略模型的概念,針對個案系統對各個單元來實際設計出涵概範圍較廣的測試案例,並且透過測試設計模式的規範與測試開發工具的幫助來實作出具有可重覆使用性的軟體單元測試自動化的流程;針對導入測試自動化流程前後的比較,本研究制定四大指標:涵蓋率(Coverage)、效率(Efficiency)、成本(Cost)、準確性(Accuracy)等,來對整體效益做評估與分析,並且於最後評估的結果可以發現,在整體涵蓋率(Coverage)、效率(Efficiency)與準確性(Accuracy)的部份皆有明顯的提升,而在成本(Cost)的部份也可以看出有明顯下降的改善。zh_TW
dc.description.abstractSoftware testing is an important term in the information growing epoch, which can help us to reduce the risk of system security. Therefore, this research is a case study based on the wafer start system of A Company. The purpose is actually to construct an automation test process based on unit test phase to imporve the inconvenience during manual testing. In addition to implementing and discussing for unit test, we also do the performance evaluation. This research plans to apply and improve the concept of Heuristic Test Strategy Model (HTSM) to implement the high coverage test case for different case systems. Focusing on system units and through the test design pattern specification, we use test development tools to help develop the unit test automation process that is reusable. For benefit evaluation analysis, we will analyze four performance indices that include "Coverage", "Efficiency", "Cost", and “Accuracy". As found in the final results of the assessment, the overall coverage, efficiency, and accuracy are significantly improved, and cost can also be observed to be decreased.en_US
dc.language.isozh_TWen_US
dc.subject自動化測試zh_TW
dc.subject單元測試zh_TW
dc.subjectUnit Testen_US
dc.subjectHTSMen_US
dc.subjectAutomation Unit Testen_US
dc.title建構晶圓下線系統之單元測試自動化流程-以A公司為例zh_TW
dc.titleConstructing the automation system unit testing process for the wafer start system – A case study of A companyen_US
dc.typeThesisen_US
dc.contributor.department管理學院資訊管理學程zh_TW
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