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dc.contributor.authorChen, Cheng-Chungen_US
dc.contributor.authorYu, Peichenen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.date.accessioned2014-12-08T15:09:43Z-
dc.date.available2014-12-08T15:09:43Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0641-8en_US
dc.identifier.urihttp://hdl.handle.net/11536/7434-
dc.identifier.urihttp://dx.doi.org/10.1109/OMEMS.2007.4373863en_US
dc.description.abstractAn algorithm based on rigorous coupled wave analysis is used to calculate the reflectance of two kinds of nano-scaled textured surfaces, periodic pyramid and random pillar structures. The device dimension and angular dependence are investigated.en_US
dc.language.isoen_USen_US
dc.subjectnanostructureen_US
dc.subjectsub-wavelength structureen_US
dc.subjectSWSen_US
dc.subjectanti-reflectionen_US
dc.subjectomni-directional reflectoren_US
dc.subjectODRen_US
dc.titleReflectance study of nano-scaled textured surfacesen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/OMEMS.2007.4373863en_US
dc.identifier.journal2007 IEEE/LEOS INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICSen_US
dc.citation.spage107en_US
dc.citation.epage108en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000251224200054-
Appears in Collections:Conferences Paper


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