Reflectance study of nano-scaled textured surfaces

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Chen, Cheng-Chung	en_US
dc.contributor.author	Yu, Peichen	en_US
dc.contributor.author	Kuo, Hao-Chung	en_US
dc.date.accessioned	2014-12-08T15:09:43Z	-
dc.date.available	2014-12-08T15:09:43Z	-
dc.date.issued	2007	en_US
dc.identifier.isbn	978-1-4244-0641-8	en_US
dc.identifier.uri	http://hdl.handle.net/11536/7434	-
dc.identifier.uri	http://dx.doi.org/10.1109/OMEMS.2007.4373863	en_US
dc.description.abstract	An algorithm based on rigorous coupled wave analysis is used to calculate the reflectance of two kinds of nano-scaled textured surfaces, periodic pyramid and random pillar structures. The device dimension and angular dependence are investigated.	en_US
dc.language.iso	en_US	en_US
dc.subject	nanostructure	en_US
dc.subject	sub-wavelength structure	en_US
dc.subject	SWS	en_US
dc.subject	anti-reflection	en_US
dc.subject	omni-directional reflector	en_US
dc.subject	ODR	en_US
dc.title	Reflectance study of nano-scaled textured surfaces	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/OMEMS.2007.4373863	en_US
dc.identifier.journal	2007 IEEE/LEOS INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS	en_US
dc.citation.spage	107	en_US
dc.citation.epage	108	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000251224200054	-
顯示於類別：	會議論文