标题: | 应用失效模式与效应分析以改善半导体产品之运送货损 Applying FMEA to Improve the Cargo Loss of Semiconductor Products |
作者: | 黄心如 Huang,Hsin-Ju 陈穆臻 Chen,Mu-Chen 管理学院运输物流学程 |
关键字: | 半导体;物流;货损;失效模式与效应分析;柏拉图分析;特性要因图;Semiconductor;logistics;cargo loss;Failure Mode and Effects Analysis;Pareto Analysis;Cause & Effect diagram |
公开日期: | 2013 |
摘要: | 由于国际化的趋势,制造业仰赖国际贸易程度也高度提升。半导体产业在追求国际合作以降低制造成本的目的之下,整段制程至最后送达之目的地多半分散在不同区域且其运送服务亦与专业物流业者合作。但也因为运送的复杂度导致货损机会增加。由于半导体具有体积小、价值高等特性,因此运送期间所造成的货损不但造成半导体制造业者与顾客的损失,也威胁到客户新产品上市的机会。若能预先找出造成货损的潜在原因进而加强流程改善将对于减低损失影响有相当的帮助。失效模式与效应分析(Failure Mode and Effects Analysis, FMEA)是一个用于预测产品设计及流程潜在失效模式与原因进而达到事前预防并减低损失的分析工具,供应链品质管理的相关文献亦提到FMEA是适用于产品、流程、资源三个品质导向的分析工具。 于上述研究背景与动机下,本研究系以半导体整合元件公司为个案分析,应用失效模式与效应分析法,组成小组讨论确定半导体货物运送期间之潜在货损失效模式,并运用特性要因图找出潜在失效原因,计算各货损失效模式与潜在失效原因之风险优先指数(Risk Priority Number, RPN)。最后利用柏拉图分析(Pareto Analysis ) 挑选出高风险之货损潜在失效原因,并由专案小组讨论并提出改善建议。 As the trend of internationalization, manufacturing industries have been highly depending on international trade. To reduce operation cost, Semiconductor industry has started production in low labor cost area globally, and this has caused the transportation service more complicated, and also increasing the risk of cargo damage. Due to semiconductor goods volume small but with high value, the cargo damage will not only cause the goods value lose, but also threaten the time to market. It would be highly helpful if a firm can predict and recognize the potential failure mode and take preliminary action to prevent damage. Failure Mode and Effects Analysis is the tool to predict potential failure modes and causes at the stage of product design or production flow in order to take proper action and reduce the lost. In the supply chain quality management related literature, it is also mentioned FMEA can be used at product, process and resource oriented quality analysis. This study is based on semiconductor integrated device company case study applying FMEA and following the steps of forming a team to define the potential damage failure modes and causes by Cause & Effect diagram. Risk Priority Number is calculated for each potential damage failure modes and causes. Finally, Pareto Analysis is here used to select those contributed 80% RPN weighting failure. Suggestions for reducing the potential damage risk according to the analysis will be proposed accordingly. |
URI: | http://140.113.39.130/cdrfb3/record/nctu/#GT070063614 http://hdl.handle.net/11536/76372 |
显示于类别: | Thesis |