統計資料
總造訪次數
| 檢視 | |
|---|---|
| Trapping and de-trapping characteristics in PBTI and dynamic PBTI between HfO2 and HfSiON gate dielectrics | 108 |
本月總瀏覽
檔案下載
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國家瀏覽排行
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| 中國 | 94 |
| 美國 | 14 |
縣市瀏覽排行
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| Shenzhen | 94 |
| Menlo Park | 6 |
| Kensington | 4 |
| Oakland | 3 |
| Edmond | 1 |
| 檢視 | |
|---|---|
| Trapping and de-trapping characteristics in PBTI and dynamic PBTI between HfO2 and HfSiON gate dielectrics | 108 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 中國 | 94 |
| 美國 | 14 |
| 檢視 | |
|---|---|
| Shenzhen | 94 |
| Menlo Park | 6 |
| Kensington | 4 |
| Oakland | 3 |
| Edmond | 1 |