完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 李銘祥 | en_US |
dc.contributor.author | Ming-Shang Lee | en_US |
dc.contributor.author | 陳瑞順 | en_US |
dc.contributor.author | Dr. Ruey-Shun Chen | en_US |
dc.date.accessioned | 2014-12-12T02:50:00Z | - |
dc.date.available | 2014-12-12T02:50:00Z | - |
dc.date.issued | 2004 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT009264524 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/77643 | - |
dc.description.abstract | IC測試業是一個靠出售測試機台產能的服務業,由顧客提供待測IC,經由測試廠測試後將結果回報給顧客。在半導體製程中,IC測試與IC封裝同為後段製程的一環,近年來半導體產業隨著市場需求擴大而蓬勃發展。目前產業所面臨的競爭環境挑戰有產品生命週期變短;顧客要求交貨期縮短;產品功能或特徵的多樣性及高品質;採用更先進的製程生產與資訊科技,而強調以製造流程為取向,以先進資訊科技導入製造流程,深化生產過程的資訊化與自動化是備受矚目的解決途徑。 本研究是以邏輯IC測試廠的最終測試測試流程為探討對象,將邏輯IC最終測試的軟體作業流程分為前置作業、測試作業以及報表產出作業,依照前置作業與報表產出作業的特性導入電腦整合製造系統,使得作業流程資訊化,並且以調查方法比較分析電腦整合製造系統導入前後的效益。研究結果發現:電腦整合製造系統導入後,增加了測試程式存置的安全性以及測試結果報表電子檔名的正確率,並且有效管理測試程式。 | zh_TW |
dc.description.abstract | IC testing industry is a service industry which sales tester capacity to customers. Customers supply IC to Testing House and Testing House reports the summary report to customers after finishing IC testing. In semiconductor manufacturing process, IC Testing and IC Assembly are involved in the second half process. The market of semiconductor industry obviously increased because of market’s demand in recent years. The challenges in competitive environment to semiconductor industry so far are product life cycle time is shorter than before, customer’s shipping time is shorter than before, complexity and high quality in product functions, using more advanced manufacturing process and information technology. It’s a well-known way to enhance information technology and automation in production process by using advanced information technology which was installed to production process. The object of this research is the process of logic IC final testing in Testing House. Divided this process of software system operation into first operation, testing operation, output operation of summary report, and depended on the characteristics of first operation and output operation of summary report to install CIM system in order to use information technology in the process of operation. In final, estimate the performances before installing CIM system and after installing CIM system, by using method of investigation. The research conclusion is that both of the access security for Test Program and the filename rightness of IC Testing summary report increased after installing CIM system. By the way, Test Program can be efficiently control. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 最終測試 | zh_TW |
dc.subject | 電腦整合製造 | zh_TW |
dc.subject | 整體服務 | zh_TW |
dc.subject | 網路檔案系統 | zh_TW |
dc.subject | 軟體作業流程 | zh_TW |
dc.subject | Final Test | en_US |
dc.subject | Computer Integrated Manufacturing | en_US |
dc.subject | Turn-Key Service | en_US |
dc.subject | Network File System | en_US |
dc.subject | Process of software system operation | en_US |
dc.title | 電腦整合製造系統在邏輯IC測試流程之應用 | zh_TW |
dc.title | The Application of Computer Integrated Manufacturing System for Logic IC Testing | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 管理學院資訊管理學程 | zh_TW |
顯示於類別: | 畢業論文 |