Thickness dependence of refractive index for anodic aluminium oxide films

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DC Field	Value	Language
dc.contributor.author	Chiu, RL	en_US
dc.contributor.author	Chang, PH	en_US
dc.date.accessioned	2014-12-08T15:02:04Z	-
dc.date.available	2014-12-08T15:02:04Z	-
dc.date.issued	1997-01-15	en_US
dc.identifier.issn	0261-8028	en_US
dc.identifier.uri	http://hdl.handle.net/11536/777	-
dc.language.iso	en_US	en_US
dc.title	Thickness dependence of refractive index for anodic aluminium oxide films	en_US
dc.type	Article	en_US
dc.identifier.journal	JOURNAL OF MATERIALS SCIENCE LETTERS	en_US
dc.citation.volume	16	en_US
dc.citation.issue	2	en_US
dc.citation.spage	174	en_US
dc.citation.epage	178	en_US
dc.contributor.department	材料科學與工程學系	zh_TW
dc.contributor.department	Department of Materials Science and Engineering	en_US
dc.identifier.wosnumber	WOS:A1997WE27400025	-
dc.citation.woscount	8	-
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