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dc.contributor.author吳忠穎en_US
dc.contributor.authorZhong-Ying Wuen_US
dc.contributor.author陳志隆en_US
dc.contributor.author戴亞翔en_US
dc.contributor.authorJyh-Long Chernen_US
dc.contributor.authorYa-Hsiang Taien_US
dc.date.accessioned2014-12-12T02:54:15Z-
dc.date.available2014-12-12T02:54:15Z-
dc.date.issued2005en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009315521en_US
dc.identifier.urihttp://hdl.handle.net/11536/78607-
dc.description.abstract三維物體表面量測的應用廣泛,如產品檢測,不規則物體表面重建等。而如何可以快速量測而且精確是為首要目標。本論文研究是透過光柵投影在物體表面,量測相位的變化,去取得物體表面座標。並先以MATLAB數學模擬軟體,模擬實驗架構,分析此方法的誤差。最後完成實驗量測系統,比較模擬與實驗結果。我們釐清相位量測與三維掃描之關係,並完成實驗驗證。zh_TW
dc.description.abstractThe application of surface profile measurement is very extensive, such as product testing, reverse engineering, and so on, while how to make the measurement fast and accurate has been crucial. In this paper, we deduce the surface profile of a 3D diffuse object by measurement of the phase distribution across the image of a projected grating deformed by the surface. As a detailed evaluation, we first simulated the experimental structure by using MATLAB software, and explored possible error produced by the corresponding approach. Finally, we have built up the system, tested over different object forms, and compared the results with simulation. An effective phase-measuring profilometry of 3D objects has been realized through this thesis study.en_US
dc.language.isozh_TWen_US
dc.subject相位量測zh_TW
dc.subject三維掃描zh_TW
dc.subjectPhase-measuringen_US
dc.subject3-D profilometryen_US
dc.title相位量測與三維掃描及其實驗驗證zh_TW
dc.titlePhase-measuring profilometry of 3D objectsen_US
dc.typeThesisen_US
dc.contributor.department顯示科技研究所zh_TW
顯示於類別:畢業論文