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dc.contributor.authorLin, Chia-Shengen_US
dc.contributor.authorChen, Ying-Chungen_US
dc.contributor.authorChang, Ting-Changen_US
dc.contributor.authorHsu, Wei-Cheen_US
dc.contributor.authorChen, Shih-Chingen_US
dc.contributor.authorLi, Hung-Weien_US
dc.contributor.authorTu, Kuan-Jenen_US
dc.contributor.authorJian, Fu-Yenen_US
dc.contributor.authorChen, Te-Chihen_US
dc.date.accessioned2014-12-08T15:10:21Z-
dc.date.available2014-12-08T15:10:21Z-
dc.date.issued2009en_US
dc.identifier.issn1099-0062en_US
dc.identifier.urihttp://hdl.handle.net/11536/7906-
dc.identifier.urihttp://dx.doi.org/10.1149/1.3115400en_US
dc.description.abstractIn this work, the negative bias temperature instability (NBTI) in low temperature polycrystalline silicon thin-film transistors in a darkened and in an illuminated environment was investigated. Experimental results reveal that the generation of interface state density (N(it)) showed no change between the different NBTI stresses. Nevertheless, the degradation of the grain boundary trap (N(trap)) under illumination was more significant than that in the darkened environment. This phenomenon is mainly caused by the extra number of holes generated during the illuminated NBTI stress.en_US
dc.language.isoen_USen_US
dc.subjectelemental semiconductorsen_US
dc.subjectgrain boundariesen_US
dc.subjectinsulated gate field effect transistorsen_US
dc.subjectinterface statesen_US
dc.subjectsemiconductor device reliabilityen_US
dc.subjectsiliconen_US
dc.subjectthin film transistorsen_US
dc.titleIllumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/1.3115400en_US
dc.identifier.journalELECTROCHEMICAL AND SOLID STATE LETTERSen_US
dc.citation.volume12en_US
dc.citation.issue6en_US
dc.citation.spageH229en_US
dc.citation.epageH232en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000265085000022-
dc.citation.woscount1-
Appears in Collections:Articles