标题: 矽基板上矽奈米柱的形成与特性分析
Characteristics of Si nanopillars Formatted on Si substrate
作者: 林皇伸
Huang-Shen Lin
林恭如
郭浩中
Gong-Ru Lin
Hao-Chang Kuo
光电工程学系
关键字: 矽;奈米针;自我凝聚;镍;活化性离子蚀刻;光激发;奈米;光性;反射率;量子局限;Si;nanopillar;self-assemble;Ni;reactive ion etching;photoluminescence;nano;optical;reflective ratio
公开日期: 2005
摘要: 在本论文中,我们成功地利用二氧化矽薄膜当缓冲层,使得镍的奈米颗粒成功地快速凝聚在矽的基板上。因为矽的高热导148 W/m-K造成热快速散逸,所以奈米镍颗粒很难直接地聚集在矽的基板上。藉由厚度200 Å且热导只有1.35 W/m-K的二氧化矽当缓冲层,阻止了NiSi2化合物的产生,和让奈米镍颗粒因为在镍和矽界面之间吸附力减小与热的累积,更容易形成自我凝聚。因此,奈米镍颗粒可以加速形成,退火时间大大缩短到22秒。奈米颗粒的大小和密度平均是30奈米和7□1010 cm-2。利用镍在二氧化矽层上自我凝聚成的奈米粒当奈米遮罩,经过活化离子式蚀刻后,可以在矽的基板上制造出大面积的矽奈米针阵列,而针的大小可以被控制到小于50奈米。在我们的实验中,矽奈米针的最理想高宽比是8。此时,针的平均大小和高度分别是40奈米和400奈米。去除掉在矽的基板上的奈米粒和二氧化矽后,从矽奈米柱发出的光激发可以发现到400到600奈米的可见波段和750奈米的近远红外波段。400奈米到600奈米的可见波段主要源自于氧的弱键结(WOB)、中性的氧化缺陷(NOV)与E’缺陷。更进一步地,因为矽奈米针持续氧化产生在光激发谱上的蓝位移现象和产生在变功率光激发谱上的强度饱和现象,所以成功地证实750奈米波段是量子局限效应。其他在电性上,相较于矽的靶材,矽奈米针拥有较快的充放电速度、较低的电阻和超低漏电流,而在光性,则明显有较低的反射率。
In this essay, rapid self-aggregation of Ni nanodots on Si substrate covered with a thin SiO2 buffered layer is investigated. Ni nanodots are hard to self-aggregate on highly heat dissipated Si substrate with a thermal conductivity of 148 W/m-K. Adding 200Å-thick SiO2 buffer with an ultralow thermal conductivity of 1.35 W/m-K prevents the formation of NiSi2 compounds, facilitates the self-assembly of Ni nanodots from enhanced heat accumulation and released Ni adhesion with Si. Formation of Ni nanodots can therefore be accelerated with size and density of 30 nm and 7□1010 cm-2, respectively, under an annealing time greatly shortened to 22 sec. With the advantage of the self-assemble Ni/SiO2 nano-dots based nano-mask, a large-area Si nano-pillar array with rod size of <50 nm can be formatted on Si substrate through the induced coupled plasma reactive ion etching (ICP-RIE) procedure. In our experiment, the optimum aspect ratio of the Si nanopillars is 8 with the average diameter of 40 nm and the average height of 400 nm. After removing Ni dots and the SiO2 film on the Si substrate, both the visible 400 nm-600 nm and near infrared 750nm photoluminescence from the Si nano-pillar sample were observed and analyzed. The visible emission 400 nm to 600 nm mainly originated from the weak oxygen bond (WOB) the neutral oxygen vacancy (NOV) defects, and the E’ defects. Moreover, the peak wavelength of 750 nm is emitted from the quantum confining centers proven by the blue shift of the oxidizing Si nanopillars in the μPL and the saturating peak intensity in the power dependentμPL. Comparing to the bulk structure, the Si nanopillars owned the high charging and discharging speed、low resisters and no leakage current in electrics and the low reflectance in optics.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009324526
http://hdl.handle.net/11536/79188
显示于类别:Thesis


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