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dc.contributor.authorTing, Chia-Jenen_US
dc.contributor.authorChen, Chi-Fengen_US
dc.contributor.authorChou, C. P.en_US
dc.date.accessioned2014-12-08T15:10:28Z-
dc.date.available2014-12-08T15:10:28Z-
dc.date.issued2009en_US
dc.identifier.issn0030-4026en_US
dc.identifier.urihttp://hdl.handle.net/11536/7996-
dc.identifier.urihttp://dx.doi.org/10.1016/j.ijleo.2008.03.011en_US
dc.description.abstractAntireflection subwavelength structures (ASSs) are analyzed by using the finite difference time domain (FDTD) method in the visible light spectrum. Low reflectance can be obtained by both the conical and pyramidal shapes over a broadband range. Comparing the reflectance of different structure shapes and aspect ratios by the FDTD method, it shows that the antireflection efficiencies of the pyramidal structures are better than that of the conical structures when the aspect ratio is up to 0.8. It is found that, for the conical structure surface, the average transmittance increases gradually with the aspect ratio and the average transmittance is about 99.6% with the aspect ratio of 2.0. However, for the pyramidal structure with the aspect ratio ranging from 1.0 to 2.0, the average transmittance is up to 99.7%. (C) 2008 Elsevier GmbH. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectSubwavelength structureen_US
dc.subjectNanostructureen_US
dc.subjectAntireflectionen_US
dc.subjectFresnel reflection finite difference time domainen_US
dc.titleAntireflection subwavelength structures analyzed by using the finite difference time domain methoden_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.ijleo.2008.03.011en_US
dc.identifier.journalOPTIKen_US
dc.citation.volume120en_US
dc.citation.issue16en_US
dc.citation.spage814en_US
dc.citation.epage817en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.identifier.wosnumberWOS:000271991400004-
dc.citation.woscount4-
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