容許時間抖動影響之微分非線性量測方法

Abstract

隨著科技的發達，電路越來越複雜，但體積越來越小時，慢慢的很多原本可以忽略的誤差，現卻變成很多難以克服的問題，如時間抖動誤差。IEEE 1057裡所介紹的微分非線性量測方法(線性坡度質方圖方法)，如果在時間抖動較為嚴重的情況下，合理的測試時間內，已無法正確的量測到微分非線性。 為了能在時間抖動的影響下，正確的量測微分非線性，在這篇論文中，我們提出了一個「累積微分非線性」的量測方法，它可以量測容許時間抖動的微分非線性。利用時間抖動的特性，做微分非線性的分析。與線性坡度質方圖方法相比，在一個具相同時間抖動的測試環境下，可以使用較少的取樣時間，得到更正確的微分非線性。

As the prosperity of technology, circuit becomes more complicated and scale is going to be smaller. Thus, there’re many problems which are used to be treated as bias and can be ignored originally become much difficulty to overcome at present , jitter for example .Differential non-linearity measurement (Linear Ramp histogram method) introduced in IEEE 1057 can’t measure Differential non-linearity precisely within reasonable time frame in the case of turbulent jitter. To have accurate measurement of Differential non-linearity under the influence of jitter, we propose a method called “Cumulative Differential non-linearity” in this paper. It can measure Differential non-linearity with jitter allowed. We use the characteristic of jitter to analyze Differential non-linearity. Compared with the method of Linear Ramp histogram method, we can get more precise Differential non-linearity by less time of sampling in the same test environment with jitter effect.