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dc.contributor.authorRodriguez, Brian J.en_US
dc.contributor.authorChu, Y. H.en_US
dc.contributor.authorRamesh, R.en_US
dc.contributor.authorKalinin, Sergei V.en_US
dc.date.accessioned2014-12-08T15:10:47Z-
dc.date.available2014-12-08T15:10:47Z-
dc.date.issued2008-10-06en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2993327en_US
dc.identifier.urihttp://hdl.handle.net/11536/8261-
dc.description.abstractThe ferroelectric polarization switching behavior at the 24 degrees (100) tilt grain boundary (GB) in an epitaxial multiferroic BiFeO(3) bicrystal film is studied using piezoresponse force microscopy (PFM). The PFM amplitudes across positively and negatively poled GB regions suggest the presence of a frozen polarization component at the interface. The switching experiments demonstrate that the GB attracts the domain wall and acts as a pinning center. The PFM results are compared with conductive atomic force microscopy and spectroscopy, which suggest domain wall pinning at the GB can be partially attributed to increased conductance at the GB. (C) 2008 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleFerroelectric domain wall pinning at a bicrystal grain boundary in bismuth ferriteen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2993327en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume93en_US
dc.citation.issue14en_US
dc.citation.epageen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000259965400040-
dc.citation.woscount22-
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