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dc.contributor.authorJang, Der-Junen_US
dc.contributor.authorLee, Meng-Enen_US
dc.contributor.authorChung, Yung-Hsienen_US
dc.contributor.authorYang, Chu-Shouen_US
dc.contributor.authorChou, Wu-Chingen_US
dc.date.accessioned2014-12-08T15:10:58Z-
dc.date.available2014-12-08T15:10:58Z-
dc.date.issued2008-09-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.47.7056en_US
dc.identifier.urihttp://hdl.handle.net/11536/8395-
dc.description.abstractThe energy relaxations of Zno(0.91)Cd(0.09)Se multiquantum wells and epilayer structures were studied with an ultrafast time-resolved photoluminescence apparatus. The increase in the rise time of photoluminescence with decreasing photon energy and the redshift of the peak energy of time-resolved photoluminescence spectra with the delay time are attributed to the band-filling effect and energy relaxation of hot carriers. The derived carrier temperature decreases rapidly within the first 10 ps after photoexcitation and tit a much slower rate thereafter. The fast carrier cooling can be explained by the longitudinal optical (LO) phonon emissions by carriers through the Frohlich interaction. The obtained effective scattering times of carrier and LO phonons are comparable to the theoretical prediction of 20 fs for multi-quantum well (MQW) of 20 nm well thickness and the epilayer. The slow carrier capture process may account for the long effective scattering time of 35 fs for the MQWs of 5 nm well thickness.en_US
dc.language.isoen_USen_US
dc.subjectZnCdSeen_US
dc.subjectquantum wellen_US
dc.subjectcarrier captureen_US
dc.subjecthot carrieren_US
dc.subjectenergy relaxationen_US
dc.subjectoptical phononen_US
dc.titleCarrier relaxation of ZnCdSe/ZnSe quantum wellsen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.47.7056en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume47en_US
dc.citation.issue9en_US
dc.citation.spage7056en_US
dc.citation.epage7059en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000259657700009-
dc.citation.woscount1-
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