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dc.contributor.authorChen, Wei-Zenen_US
dc.contributor.authorHuang, Guan-Shengen_US
dc.date.accessioned2014-12-08T15:11:13Z-
dc.date.available2014-12-08T15:11:13Z-
dc.date.issued2008-07-01en_US
dc.identifier.issn1549-8328en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSI.2008.916507en_US
dc.identifier.urihttp://hdl.handle.net/11536/8605-
dc.description.abstractThis paper presents the design of a low-power programmable pseudorandom word generator (PRWG) and a low-noise clock multiplier unit (CMU) for high-speed SerDes applications. The PRWG is capable of producing test patterns with sequence length of 2(7) - 1, 2(10) - 1, 2(15) - 1, 2(23) - 1, and 2(31) - 1 b according to CCITT recommendations, and the random word is 16-bit wide. High-speed and low-power operations of the PRWG are achieved by parallel feedback techniques. The measured jitter of the CMU is only 3.56 ps(rms), and the data jitter at the PRWG output is mainly determined by the CMU. Implemented in an 0.18-mu m CMOS process, the power dissipation for the PRWG is only 10.8 mW, and the CMU consumes about 87 mW from a 1.8-V supply. This PRWG can be used as a low-cost substitute for external parallel test pattern generators.en_US
dc.language.isoen_USen_US
dc.subjectClock multiplier unit (CMU)en_US
dc.subjectparallel feedback shift register (PFSR)en_US
dc.subjectpsuedorandom word generator (PRWG)en_US
dc.subjectSerDesen_US
dc.titleLow-Power Programmable Pseudorandom Word Generator and Clock Multiplier Unit for High-Speed SerDes Applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCSI.2008.916507en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERSen_US
dc.citation.volume55en_US
dc.citation.issue6en_US
dc.citation.spage1495en_US
dc.citation.epage1501en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000257711600010-
dc.citation.woscount0-
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