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dc.contributor.authorChen, Jun-Rongen_US
dc.contributor.authorKo, Tsung-Shineen_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.authorChang, Yi-Anen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorKuo, Yen-Kuangen_US
dc.contributor.authorTsai, Jui-Yenen_US
dc.contributor.authorLaih, Li-Wenen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.date.accessioned2014-12-08T15:11:19Z-
dc.date.available2014-12-08T15:11:19Z-
dc.date.issued2008-07-01en_US
dc.identifier.issn0733-8724en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JLT.2008.920639en_US
dc.identifier.urihttp://hdl.handle.net/11536/8686-
dc.description.abstractInGaP/AIGaInP 660-nm resonant-cavity light-emitting diodes (RCLEDs) with stable temperature characteristics have been achieved by extending the resonant cavity length from one optical wavelength (1 lambda) to three optical wavelengths (3 lambda) and tripling the number of quantum wells. When the operation temperature increases from 25 degrees C to 95 degrees C, the degree of power variation at 20 mA is reduced from -2.1 dB to -0.6 dB for the conventional 1-lambda cavity RCLEDs and 3-lambda cavity RCLEDs, respectively. In order to interpret the temperature-dependent experimental results, advanced device simulation is applied to model the RCLEDs with different cavity designs. According to the numerical simulation results, we deduce that the stable temperature-dependent output performance should originate from the reduction of electron leakage current and thermally enhanced hole transport for the 3-lambda cavity AIGaInP RCLEDs.en_US
dc.language.isoen_USen_US
dc.subjectLeakage currenten_US
dc.subjectmodelingen_US
dc.subjectpolymethyl methacrylate plastic optic fiber (POF)en_US
dc.subjectresonant-cavity light-emitting diode (RCLED)en_US
dc.subjectsemiconductor deviceen_US
dc.titleFabrication and Characterization of Temperature Insensitive 660-nm Resonant-Cavity LEDsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JLT.2008.920639en_US
dc.identifier.journalJOURNAL OF LIGHTWAVE TECHNOLOGYen_US
dc.citation.volume26en_US
dc.citation.issue13-16en_US
dc.citation.spage1891en_US
dc.citation.epage1900en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000260874000019-
dc.citation.woscount0-
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