完整後設資料紀錄
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dc.contributor.authorLi, Yimingen_US
dc.contributor.authorChen, Ying-Chiehen_US
dc.date.accessioned2014-12-08T15:11:21Z-
dc.date.available2014-12-08T15:11:21Z-
dc.date.issued2007en_US
dc.identifier.isbn978-0-7354-0476-2en_US
dc.identifier.issn0094-243Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/8712-
dc.description.abstractIn this work, we theoretically optimize the high frequency property of silicon-germanium heterojunction bipolar transistors (HBTs) using a geometry programming (GP) technique. It is known that the base transit time of semiconductor devices potentially is a function of doping profile, device geometry and materials which significantly dominate the high frequency properly of HBTs. To maximize the cut-off frequency of HBTs, the subject is formulated as a GP optimization problem by physically considering the base transit time as an object function. The GP model is solved numerically so that the cutoff frequency of HBT could be optimized for specified upper and lower bounds of the base doping concentration, and certain Ge composition. This work also shows that for 13% Ge profile, the cut-off frequency may reach a maximal value.en_US
dc.language.isoen_USen_US
dc.subjectbipolar transistorsen_US
dc.subjectimpurity dopingen_US
dc.subjectSiGeen_US
dc.subjectHBTen_US
dc.subjecthigh frequencyen_US
dc.subjectoptimizationen_US
dc.titleHigh frequency property optimization of heterojunction bipolar transistors using geometric programmingen_US
dc.typeProceedings Paperen_US
dc.identifier.journalCOMPUTATION IN MODERN SCIENCE AND ENGINEERING VOL 2, PTS A AND Ben_US
dc.citation.volume2en_US
dc.citation.spage997en_US
dc.citation.epage1000en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000252602900247-
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