完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChang, Kow-Mingen_US
dc.contributor.authorHuang, Sung-Hungen_US
dc.contributor.authorWu, Chin-Jyien_US
dc.contributor.authorLin, Wei-Lien_US
dc.contributor.authorChen, Wei-Chiangen_US
dc.contributor.authorChi, Chia-Weien_US
dc.contributor.authorLin, Je-Weien_US
dc.contributor.authorChang, Chia-Chiangen_US
dc.date.accessioned2014-12-08T15:11:31Z-
dc.date.available2014-12-08T15:11:31Z-
dc.date.issued2011-05-31en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2011.01.156en_US
dc.identifier.urihttp://hdl.handle.net/11536/8831-
dc.description.abstractAtmospheric-pressure plasma processing has attracted much interest for industrial applications due to its low cost, high processing speed and simple system. In this study, atmospheric-pressure plasma jet technique was developed to deposit indium-doped zinc oxide films. The inorganic metal salts of zinc nitrate and indium nitrate were used as precursors for Zn ions and In ions, respectively. The effect of different indium doping concentration on the morphological, structural, electrical and optical properties of the films was investigated. Grazing incidence X-ray diffraction results show that the deposited films with a preferred (002) orientation. The lowest resistivity of 1.8 x 10(-3) Omega cm was achieved with the 8 at.% indium-doped solution at the substrate temperature of 200 degrees C in open air, and average transmittance in the visible region was more than 80%. (C) 2011 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectTransparent conductive oxideen_US
dc.subjectAtmospheric-pressure plasmaen_US
dc.subjectIndium-doped zinc oxideen_US
dc.subjectZinc nitrateen_US
dc.subjectIndium nitrateen_US
dc.titleTransparent conductive indium-doped zinc oxide films prepared by atmospheric pressure plasma jeten_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.tsf.2011.01.156en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume519en_US
dc.citation.issue15en_US
dc.citation.spage5114en_US
dc.citation.epage5117en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000292471400095-
dc.citation.woscount14-
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