完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 張立 | en_US |
dc.contributor.author | CHANG LI | en_US |
dc.date.accessioned | 2014-12-13T10:28:38Z | - |
dc.date.available | 2014-12-13T10:28:38Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.govdoc | NSC89-2215-E009-028 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/88467 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=525772&docId=95663 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 銅連接線 | zh_TW |
dc.subject | 擴散障礙層 | zh_TW |
dc.subject | 電阻係數 | zh_TW |
dc.subject | 物理氣相沈積法 | zh_TW |
dc.subject | 材料分析 | zh_TW |
dc.subject | Copper interconnect | en_US |
dc.subject | Diffusion barrier | en_US |
dc.subject | Resistivity | en_US |
dc.subject | Physical vapor deposition | en_US |
dc.subject | Material analysis | en_US |
dc.title | 銅導線及其障礙層之材質研究 | zh_TW |
dc.title | Materials Study of Diffusion Barriers for Copper Interconnect | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 交通大學材料科學與工程研究所 | zh_TW |
顯示於類別: | 研究計畫 |