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dc.contributor.author汪大暉en_US
dc.contributor.authorWANG TAHUIen_US
dc.date.accessioned2014-12-13T10:30:06Z-
dc.date.available2014-12-13T10:30:06Z-
dc.date.issued2005en_US
dc.identifier.govdocNSC94-2215-E009-009zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/89962-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1143851&docId=219368en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.title奈米CMOS元件量子效應與電荷傳輸模擬及電性與可靠性分析(II)zh_TW
dc.titleNano-CMOS Charge Ballistic Transport, Quantum Effect, Characterization, and Reliability Study(II)en_US
dc.typePlanen_US
dc.contributor.department交通大學電子工程系zh_TW
Appears in Collections:Research Plans


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