統計資料
總造訪次數
| 檢視 | |
|---|---|
| Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution | 107 |
本月總瀏覽
| 六月 2025 | 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | |
|---|---|---|---|---|---|---|---|
| Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution | 0 | 2 | 0 | 0 | 1 | 0 | 0 |
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 96 |
| 美國 | 7 |
| 印度 | 3 |
| 越南 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 4 |
| Kensington | 2 |
| Gurgaon | 1 |
| Hanoi | 1 |
| Kirksville | 1 |
| Mumbai | 1 |