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dc.contributor.author尹慶中en_US
dc.contributor.authorYIN CHING-CHUNGen_US
dc.date.accessioned2014-12-13T10:30:29Z-
dc.date.available2014-12-13T10:30:29Z-
dc.date.issued2005en_US
dc.identifier.govdocNSC94-2212-E009-003zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/90276-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1114345&docId=211465en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.title近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(III)zh_TW
dc.titleDetermination of Residual Stresses in Nanometer Scale Heterosturctures Using Near-field Photoacoustic Microscopy(III)en_US
dc.typePlanen_US
dc.contributor.department交通大學機械工程系zh_TW
Appears in Collections:Research Plans


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