标题: 高度微缩金氧半场效电晶体机械应力效应之研究(III)
The Impact of Mechanical Stress in Highly Scaled MOSFETs(III)
作者: 陈明哲
CHEN MING-JER
交通大学电子工程系
公开日期: 2005
官方说明文件#: NSC94-2215-E009-005
URI: http://hdl.handle.net/11536/90633
https://www.grb.gov.tw/search/planDetail?id=1143836&docId=219364
显示于类别:Research Plans


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  1. 942215E009005.PDF

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