标题: | 高度微缩金氧半场效电晶体机械应力效应之研究(III) The Impact of Mechanical Stress in Highly Scaled MOSFETs(III) |
作者: | 陈明哲 CHEN MING-JER 交通大学电子工程系 |
公开日期: | 2005 |
官方说明文件#: | NSC94-2215-E009-005 |
URI: | http://hdl.handle.net/11536/90633 https://www.grb.gov.tw/search/planDetail?id=1143836&docId=219364 |
显示于类别: | Research Plans |
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